Roughness and Surface Texture: Optical Metrology with maximum flexibility

Surface texture plays a key role in manufacturing and product development, affecting the performance and reliability of products ranging from automotive components to consumer electronics and photovoltaics as well as space applications. 

Roughness is the most commonly used parameter to characterize surface texture. Its exact analysis is integral in optimizing manufacturing processes and improving product quality. The ability to measure different sized samples has become increasingly important in industrial R&D or multi-disciplinary academic research environments. 

The White Light Interferometry (WLI) technique enables sub-nm vertical resolution and has been implemented on both table-top and large systems.

About the speakers

Dr Samuel Lesko, Director of Technology & Applications Devlp. in Tribology and Profilers, has extensive experience in optical profiler and WLI applications. 

Dr Udo Volz, Application Scientist, based in Karlsruhe, Germany, has over 20 years of experience in surface characterisation and Optical Metrology.